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Yaldagard, Mohammad Amin (author), Diware, S.S. (author), Joshi, R.V. (author), Hamdioui, S. (author), Bishnoi, R.K. (author)Resistive random access memory (RRAM) based computation-in-memory (CIM) architectures can meet the unprecedented energy efficiency requirements to execute AI algorithms directly on edge devices. However, the read-disturb problem associated with these architectures can lead to accumulated computational errors. To achieve the necessary level of...conference paper 2023
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Yuan, S. (author), Zhang, Z. (author), Fieback, M. (author), Xun, H. (author), Marinissen, E. J. (author), Kar, G. S. (author), Rao, S. (author), Couet, S. (author), Taouil, M. (author), Hamdioui, S. (author)The development of Spin-Transfer Torque Magnetic RAMs (STT-MRAMs) mass production requires high-quality test solutions. Accurate and appropriate fault modeling is crucial for the realization of such solutions. This paper targets fault modeling and test generation for all interconnect and contact defects in STT-MRAMs and shows that using the...conference paper 2023
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Gomony, Manil Dev (author), de Putter, Floran (author), Gebregiorgis, A.B. (author), Paulin, Gianna (author), Mei, Linyan (author), Jain, Vikram (author), Hamdioui, S. (author), Bishnoi, R.K. (author), Sanchez, Victor (author)With the rise of deep learning (DL), our world braces for artificial intelligence (AI) in every edge device, creating an urgent need for edge-AI SoCs. This SoC hardware needs to support high throughput, reliable and secure AI processing at ultra-low power (ULP), with a very short time to market. With its strong legacy in edge solutions and open...conference paper 2023
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Shahroodi, Taha (author), Cardoso, Rafaela (author), Zahedi, M.Z. (author), Wong, J.S.S.M. (author), Bosio, Alberto (author), O'Connor, Ian (author), Hamdioui, S. (author)This paper investigates the potential of a compute-in-memory core based on optical Phase Change Materials (oPCMs) to speed up and reduce the energy consumption of the Matrix-Matrix-Multiplication operation. The paper also proposes a new data mapping for Binary Neural Networks (BNNs) tailored for our oPCM core. The preliminary results show a...conference paper 2023
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Zahedi, M.Z. (author), Custers, Geert (author), Shahroodi, Taha (author), Gaydadjiev, G. (author), Wong, J.S.S.M. (author), Hamdioui, S. (author)Performing analysis on large graph datasets in an energy-efficient manner has posed a significant challenge; not only due to excessive data movements and poor locality, but also due to the non-optimal use of high sparsity of such datasets. The latter leads to a waste of resources as the computation is also performed on zero's operands which do...conference paper 2023
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Yuan, S. (author), Taouil, M. (author), Fieback, M. (author), Xun, H. (author), Marinissen, Erik Jan (author), Kar, Gouri Sankar (author), Rao, Sidharth (author), Couet, Sebastien (author), Hamdioui, S. (author)The development of Spin-transfer torque magnetic RAM (STT-MRAM) mass production requires high-quality dedicated test solutions, for which understanding and modeling of manufacturing defects of the magnetic tunnel junction (MTJ) is crucial. This paper introduces and characterizes a new defect called Back-Hopping (BH); it also provides its...conference paper 2023
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Xun, H. (author), Fieback, M. (author), Yuan, S. (author), Zhang, Ziwei (author), Taouil, M. (author), Hamdioui, S. (author)Resistive Random Access Memory (RRAM) is a potential technology to replace conventional memories by providing low power consumption and high-density storage. As various manufacturing vendors make significant efforts to push it to high-volume production and commercialization, high-quality and efficient test solutions are of great importance. This...conference paper 2023
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Fieback, M. (author), Bradarić, Filip (author), Taouil, M. (author), Hamdioui, S. (author)Resistive Random Access Memory (RRAM, or ReRAM) is a promising memory technology to replace Flash because of its low power consumption, high storage density, and simple integration in existing IC production processes. This has motivated many companies to invest in this technology. However, RRAM manufacturing introduces new failure mechanisms and...conference paper 2023
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Singh, A. (author), Bishnoi, R.K. (author), Kaichouhi, A. (author), Diware, S.S. (author), Joshi, R.V. (author), Hamdioui, S. (author)Analog computation-in-memory (CIM) architecture alleviates massive data movement between the memory and the processor, thus promising great prospects to accelerate certain computational tasks in an energy-efficient manner. However, data converters involved in these architectures typically achieve the required computing accuracy at the expense...conference paper 2023
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Diware, S.S. (author), Gebregiorgis, A.B. (author), Joshi, R.V. (author), Hamdioui, S. (author), Bishnoi, R.K. (author)Memristor-based computation-in-memory (CIM) can achieve high energy efficiency by processing the data within the memory, which makes it well-suited for applications like neural networks. However, memristors suffer from conductance variation problem where their programmed conductance values deviate from the desired values. Such variations lead...conference paper 2023
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Xun, H. (author), Fieback, M. (author), Yuan, S. (author), Aziza, Hassen (author), Heidekamp, Mathijs (author), Copetti, Thiago (author), Poehls, Leticia Bolzani (author), Taouil, M. (author), Hamdioui, S. (author)Resistive Random Access Memories (RRAMs) are being commercialized with significant investment from several semiconductor companies. In order to provide efficient and high-quality test solutions to push high-volume production, a comprehensive understanding of manufacturing defects is significantly required. This paper identifies and characterizes...conference paper 2023
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Bishnoi, R.K. (author), Diware, S.S. (author), Gebregiorgis, A.B. (author), Thomann, Simon (author), Mannaa, Sara (author), Deveautour, Bastien (author), Marchand, Cedric (author), Bosio, Alberto (author), Deleruyelle, Damien (author), O'Connor, Ian (author), Amrouch, Hussam (author), Hamdioui, S. (author)Deep Learning (DL) has recently led to remark-able advancements, however, it faces severe computation related challenges. Existing Von-Neumann-based solutions are dealing with issues such as memory bandwidth limitations and energy inefficiency. Computation-In-Memory (CIM) has the potential to address this problem by integrating processing...conference paper 2023
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Aouichi, A. (author), Yuan, S. (author), Fieback, M. (author), Rao, Siddharth (author), Kim, Woojin (author), Marinissen, Erik Jan (author), Couet, Sebastien (author), Taouil, M. (author), Hamdioui, S. (author)Spin-Transfer Torque Magnetic RAMs (STT-MRAMs) are on their way to commercialization. However, obtaining high-quality test and diagnosis solutions for STT-MRAMs is challenging due to the existence of unique defects in Magnetic Tunneling Junctions (MTJs). Recently, the Device-Aware Test (DA-Test) method has been put forward as an effective...conference paper 2023
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Masoumian, S. (author), Maes, Roel (author), Wang, Rui (author), Yerriswamy, Karthik Keni (author), Schrijen, Geert-Jan (author), Hamdioui, S. (author), Taouil, M. (author)SRAM Physical Unclonable Functions (PUFs) are one of the popular forms of PUFs that can be used to generate unique identifiers and randomness for security purposes. Hence, their resilience to attacks is crucial. The probability of attacks increases when the SRAM PUF start-up values follow a predictable pattern which we refer to as bias. In this...conference paper 2023
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Gomony, Manil Dev (author), Gebregiorgis, A.B. (author), Fieback, M. (author), Geilen, Marc (author), Stuijk, Sander (author), Richter-Brockmann, Jan (author), Bishnoi, R.K. (author), Taouil, M. (author), Hamdioui, S. (author)This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these...conference paper 2023
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Xun, H. (author), Yuan, S. (author), Fieback, M. (author), Taouil, M. (author), Hamdioui, S. (author), Aziza, Hassen (author)Many companies are heavily investing in the commercialization of Resistive Random Access Memories (RRAMs). This calls for a comprehensive understanding of manufacturing defects to develop efficient and high-quality test and diagnosis solutions to push high-volume production. This paper identifies and characterizes a new defect based on silicon...conference paper 2023
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Aziza, Hassen (author), Zambelli, Cristian (author), Hamdioui, S. (author), Diware, S.S. (author), Bishnoi, R.K. (author), Gebregiorgis, A.B. (author)Emerging device technologies such as Resistive RAMs (RRAMs) are under investigation by many researchers and semiconductor companies; not only to realize e.g., embedded non-volatile memories, but also to enable energy-efficient computing making use of new data processing paradigms such as computation-in-memory. However, such devices suffer from...conference paper 2023
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Shahroodi, Taha (author), Miao, Michael (author), Zahedi, M.Z. (author), Wong, J.S.S.M. (author), Hamdioui, S. (author)The high execution time of DNA sequence alignment negatively affects many genomic studies that rely on sequence alignment results. Pre-alignment filtering was introduced as a step before alignment to reduce the execution time of short-read sequence alignment greatly. With its success, i.e., achieving high accuracy and thus removing...conference paper 2023
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Siddiqi, M.A. (author), Hernández, Jan Andrés Galvan (author), Gebregiorgis, A.B. (author), Bishnoi, R.K. (author), Strydis, C. (author), Hamdioui, S. (author), Taouil, M. (author)Next-generation personalized healthcare devices are undergoing extreme miniaturization in order to improve user acceptability. However, such developments make it difficult to incorporate cryptographic primitives using available target tech-nologies since these algorithms are notorious for their energy consumption. Besides, strengthening these...conference paper 2023
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Aljuffri, A.A.M. (author), Saxena, Mudit (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)Security is one of the most important features that a system must provide. Depending on the application of the target device, different threats should be considered at design time. However, the attack space is vast. Hence, it is difficult to decide what components to protect, what level of protection they require and how efficient they are in...conference paper 2023