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Ishihara, R. (author), Chen, T. (author), Van der Zwan, M. (author), He, M. (author), Schellevis, H. (author), Beenakker, K. (author)Existent flat-panel display is mechanically stiff because it requires external connection of IC chips. At its present stage, displays with a-Si, metal oxide semiconductor or organic TFTs require still external connection of data driver and controllers, because of their low carrier mobilities. We will review our recent progress on direct...conference paper 2011
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Maas, D. (author), Van veldhoven, E. (author), Chen, P. (author), Sidorkin, V. (author), Salemink, H. (author), Van der Drift, E. (author), Alkemade, P. (author)The recently introduced helium ion microscope (HIM) is capable of imaging and fabrication of nanostructures thanks to its sub-nanometer sized ion probe [1,2]. The unique interaction of the helium ions with the sample material provides very localized secondary electron emission, thus providing a valuable signal for high-resolution imaging as well...conference paper 2010
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Yao, W. (author), Guo, J. (author), Chen, X. (author), Van Tooren, M. (author)With progress of space technology and increase of space mission demand, requirements for robustness and reliability of space systems are ever-increasing. For the whole space mission life cycle, the most important decisions are made in the conceptual design phase, so it is very crucial to take uncertainties into consideration in this initial...conference paper 2010
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Chen, Y. (author), Spaans, M. (author)Mega-event strategies and their impact on host cities have drawn increasing interest, as organising large-scale urban events has become part of a deliberate urban policy strategy to promote local economic growth and put the host city on the world agenda. Thus far, the research addressing what strategies can be adopted and to what extent the...conference paper 2009
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Maas, D. (author), Van Veldhoven, E. (author), Chen, P. (author), Sidorkin, V. (author), Salemink, H. (author), Van der Drift, E. (author), Alkemade, P. (author)The recently introduced helium ion microscope (HIM) is capable of imaging and fabrication of nanostructures thanks to its sub-nanometer sized ion probe [1,2]. The unique interaction of the helium ions with the sample material provides very localized secondary electron emission, thus providing a valuable signal for high-resolution imaging as well...conference paper 2009
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- van Duijsen, P. (author), Bauer, P. (author), Chen, F. (author) conference paper 2006
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