Test and Diagnosis of Hard-to-Detect Faults in FinFET SRAMs

The Fin Field-Effect Transistor (FinFET) technology became the most promising approach to enable the downscaling of technological nodes below the 20 nm threshold. However, the introduction of new technology nodes for embedded memories such as SRAMs, especially for even smaller nodes such as 10 and 5 nm, gives rise to new manufacturing failure...

Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions

As STT-MRAM mass production and deployment in industry is around the corner, high-quality yet cost-efficient manufacturing test solutions are crucial to ensure the required quality of products being shipped to end customers. This dissertation focuses on STT-MRAM testing, covering three abstraction levels: manufacturing defects, fault models, and...