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Cardoso Medeiros, G. (author), Fieback, M. (author), Gebregiorgis, A.B. (author), Taouil, M. (author), Poehls, L. B. (author), Hamdioui, S. (author)
High-quality memory diagnosis methodologies are critical enablers for scaled memory devices as they reduce time to market and provide valuable information regarding test escapes and customer returns. This paper presents an efficient Hierarchical Memory Diagnosis (HMD) approach that accurately diagnoses faults in the entire memory. Faults are...
conference paper 2022
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Kraak, D.H.P. (author), Agbo, I.O. (author), Taouil, M. (author), Hamdioui, S. (author), Weckx, Pieter (author), Cosemans, Stefan (author), Catthoor, Francky (author)
Designers typically add design margins to memories to compensate for their aging. As the aging impact increases with technology scaling, bigger margins become necessary. However, this negatively impacts area, yield, performance, and power consumption. Alternatively, mitigation schemes can be used to reduce the impact of aging. This paper...
conference paper 2019