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Mazzarella, L. (author), Alcañiz Moya, A. (author), Kawa, Eliora (author), Procel Moya, P.A. (author), Zhao, Y. (author), Han, C. (author), Yang, G. (author), Zeman, M. (author), Isabella, O. (author)
Electrical simulations show that the dipole formed at (i)a-Si:H/MoOx interface can explain electrical performance degradation. We experimentally manipulate this interface by a plasma treatment (PT) to mitigate the dipole strength without harming the optical response. The optimal PT + MoOx stack results in strongly improved electrical...
conference paper 2020