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Shi, W. (author), Theelen, Mirjam (author), Illiberi, Andrea (author), van der Sar, S.J. (author), Butterling, M. (author), Schut, H. (author), Zeman, M. (author), Brück, E.H. (author), Eijt, S.W.H. (author)
Positron annihilation lifetime spectroscopy (PALS) and Doppler broadening positron annihilation spectroscopy (DB-PAS) depth profiling demonstrate pronounced growth of vacancy clusters at the grain boundaries of as-deposited Al-doped ZnO films deposited as transparent conductive oxide (TCO) on Cu(In,Ga)Se2 (CIGS) solar cells upon accelerated...
journal article 2018
document
Shi, W. (author), Theelen, Mirjam (author), Illiberi, Andrea (author), van der Sar, S.J. (author), Butterling, M. (author), Schut, H. (author), Zeman, M. (author), Brück, E.H. (author), Eijt, S.W.H. (author)
Positron annihilation lifetime spectroscopy (PALS) and Doppler broadening positron annihilation spectroscopy DB-PAS) depth profiling demonstrate pronounced growth of vacancy clusters at the grain boundaries of as-deposited Al-doped ZnO films deposited as transparent conductive oxide (TCO) on Cu(In, Ga)Se2 (CIGS) solar cells upon accelerated...
journal article 2018
document
Illiberi, A. (author), Kudlacek, P. (author), Smets, A.H.M. (author), Creatore, M. (author), Van de Sanden, M.C.M. (author)
We have found that controlled Ar ion bombardment enhances the degradation of a-Si:H based surface passivation of c-Si surfaces. The decrease in the level of surface passivation is found to be independent on the ion kinetic energy (7–70 eV), but linearly proportional to the ion flux (6×1014–6×1015?ions?cm?2?s?1). This result suggests that the ion...
journal article 2011