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Bronsgeest, M.S. (author), Barth, J.E. (author), Swanson, L.W. (author), Kruit, P. (author)
Probe size, shape, and current are important parameters for the performance of all probe forming systems such as the scanning (transmission) electron microscope, the focused ion beam microscope, and the Gaussian electron beam lithography system. Currently, however, the relation between probe current and probe size is ill defined. The key lies in...
journal article 2008