- document
-
Lazar, S. (author), Weyher, J.L. (author), Macht, L. (author), Tichelaar, F.D. (author), Zandbergen, H.W. (author)Photochemical (PEC) etching and transmission electron microscopy (TEM) have been used to study the defects in hetero-epitaxial GaN layers. TEM proved that PEC etching reveals not only dislocations but also nanopipes in the form of protruding, whisker-like etch features. It is shown by diffraction contrast techniques that the nanopipes are screw...journal article 2004
- document
-
Zandbergen, H.W. (author)A specimen holder for an electron microscope, comprising a rod-shaped part, which is provided near one end with a tip, which tip is arranged to receive a specimen, the rod-shaped part, in use, extending with at least the tip into the electron microscope, held by clamping means present in the electron microscope, wherein first temperature control...patent 2004
- document
- Lazar, S. (author), Hebert, C. (author), Zandbergen, H.W. (author) journal article 2004
- document
- Huang, Q. (author), Foo, M.L. (author), Pascal, R.A. (author), Lynn, J.W. (author), Toby, B.H. (author), He, T. (author), Zandbergen, H.W. (author), Cava, R.J. (author) journal article 2004
- document
- Zandbergen, H.W. (author), Foo, M. (author), Xu, Q. (author), Kumar, V. (author), Cava, R.J. (author) journal article 2004
- document
- Yang, Z.Q. (author), Hendrikx, R. (author), Aarts, J. (author), Qin, Y.L. (author), Zandbergen, H.W. (author) journal article 2004
- document
- Moore, K.T. (author), Chung, B.W. (author), Morton, S.A. (author), Schwartz, A.J. (author), Tobin, J.G. (author), Lazar, S. (author), Tichelaar, F.D. (author), Zandbergen, H.W. (author), Söderlind, P. (author), van der Laan, G. (author) journal article 2004
- document
-
Pedarnig, J.D. (author), Rössler, R. (author), Delamare, M.P. (author), Lang, W. (author), Bäuerle, D. (author), Köhler, A. (author), Zandbergen, H.W. (author)Vicinal YBa2Cu3O7?? (YBCO) thin films of thickness h = 20–480?nm are grown by pulsed-laser deposition on 10° miscut (001) SrTiO3 substrates. The anisotropic resistivities, c-axis texture, and critical temperature drastically depend on the thickness of vicinal films. High-resolution electron microscopy reveals a defect microstructure with strong...journal article 2002
- document
- Stok, B.P.E. (author), Tuink, S. (author), Zandbergen, M.W. (author) report 2002
- document
-
Zandbergen, H.W. (author), Latenstein van Voorst, A. (author), Westra, C. (author), Hoveling, G.H. (author)A specimen holder for an electron microscope, comprising a bar-shaped body provided adjacent one end with means for receiving a specimen, with means being present for screening the specimen from the environment at least temporarily in airtight and moisture-proof manner in a first position, which screening means comprise at least one elastic seal...patent 1996
- document
-
Zandbergen, H.W. (author), Van Tendeloo, G. (author)High-resolution electron microscopy shows that Pb2Sr2(Ca,Y)Cu3O8+? is sensitive to air at room temperature. Planar defects are induced by exposure to air. These planar defects are due to a depletion of Pb and Cu from the three-layer block: PbO-Cu?-PbO, ? being a vacancy. Once these blocks are depleted, further depletion is enhanced, leading to...journal article 1989