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van Driel, W.D. (author), Jacobs, B. (author), Watte, P. (author), Zhao, X. (author)
Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing chances for and consequences of failures, shortening of product development and qualification...
journal article 2022
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Nunez, Alfredo (author), Jamshidi, A. (author), Wang, H. (author)
This paper presents a Pareto-based maintenance decision system for rail welds in a regional railway network. Weld health condition data are collected using a train in operation. A Hilbert spectrum-based approach is used for data processing to detect and assess the weld quality based on multiple registered dynamic responses in the axle box...
journal article 2018