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van Driel, W.D. (author), Jacobs, B. (author), Watte, P. (author), Zhao, X. (author)
Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing chances for and consequences of failures, shortening of product development and qualification...
journal article 2022