Searched for: subject%253A%2522microscopy%2522
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Vandivere, Abbie (author), van Loon, A. (author), Dore-Callewaert, T.W.J. (author), Haswell, Ralph (author), Proaño Gaibor, Art Ness (author), van Keulen, Henk (author), Leonhardt, Emilien (author), Dik, J. (author)
The background of Vermeer’s Girl with a Pearl Earring (c. 1665, Mauritshuis) has, until recently, been interpreted as a flat dark space. The painting was examined in 2018 as part of the research project The Girl in the Spotlight using a combination of micro- and macro-scale analytical techniques. The stratigraphy of the background was...
journal article 2019
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Keyvani Janbahan, A. (author), Sadeghian, Hamed (author), Goosen, J.F.L. (author), van Keulen, A. (author)
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which, besides explaining the amplitude reduction mechanism, provides...
journal article 2018
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Keyvani Janbahan, A. (author), Alijani, F. (author), Sadeghian, Hamed (author), Maturova, Klara (author), Goosen, J.F.L. (author), van Keulen, A. (author)
This paper investigates the closed-loop dynamics of the Tapping Mode Atomic Force Microscopy using a new mathematical model based on the averaging method in Cartesian coordinates. Experimental and numerical observations show that the emergence of chaos in conventional tapping mode AFM strictly limits the imaging speed. We show that, if the...
journal article 2017
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Bijster, R.J.F. (author), Sadeghian Marnani, H. (author), van Keulen, A. (author)
Optical near-field technologies such as solid immersion lenses and hyperlenses are candidate solutions for high resolution and high throughput wafer inspection and metrology for the next technology nodes. Besides sub-diffraction limited optical performance, these concepts share the necessity of extreme proximity to the sample at distances that...
conference paper 2016
Searched for: subject%253A%2522microscopy%2522
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