Searched for: subject%3A%22Dark%255C%252Bcurrent%22
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document
Abarca Prouza, A.N. (author)
This thesis describes the integration of temperature sensors into a CMOS image sensor (CIS). The temperature sensors provide the in-situ temperature of the pixels as well as the thermal distribution of the pixel array. The temperature and the thermal distribution are intended to be used to compensate for dark current affecting the CIS. Two...
doctoral thesis 2021
document
Xie, S. (author), Abarca Prouza, A.N. (author), Theuwissen, A.J.P.A.M. (author)
This brief proposes employing each of the classical 4 transistor (4T) pinned photodiode (PPD) CMOS image sensor (CIS) pixels, for both imaging and temperature measurement, intended for compensating the CISs' dark current, and dark signal non-uniformity (DSNU). The proposed temperature sensors rely on the thermal behavior of MOSFETs working in...
journal article 2020
document
Xie, S. (author), Theuwissen, A.J.P.A.M. (author)
This paper presents methodologies for suppressing the spatial and the temporal noise in a CMOS image sensor (CIS). First of all, it demonstrates by using a longer-length column bias transistor, both the fixed pattern noise (FPN) and temporal noise can be suppressed. Meantime, it employs column-level oversampling delta-sigma ADCs to suppress...
journal article 2019
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Abarca Prouza, A.N. (author), Xie, S. (author), Markenhof, Jules (author), Theuwissen, A.J.P.A.M. (author)
In this work, a novel approach is presented for measuring relative temperature variations inside the pixel array of a CMOS image sensor itself. This approach can give important information when compensation for dark (current) fixed pattern noise (FPN) is needed. The test image sensor consists of pixels and temperature sensors pixels (=Tixels)....
conference paper 2017
document
Mheen, B. (author), Song, Y.J. (author), Theuwissen, J.P. (author)
This letter presents an electrical method to reduce dark current as well as increase well capacity of four-transistor pixels in a CMOS image sensor, utilizing a small negative offset voltage to the gate of the transfer (TX) transistor particularly only when the TX transistor is off. As a result, using a commercial pixel in a 0.18 ?m CMOS process...
journal article 2008
Searched for: subject%3A%22Dark%255C%252Bcurrent%22
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