Detection of Tip-Sample Interaction in Atomic Force Microscopy: Improving the Image Resolution

Currently used imaging methods in Atomic Force Microscopy (AFM) including the use of a Lock-In Amplifier or a Phase-Locked Loop, are suboptimal. In this report, the image resolution in AFM is improved by detecting the tip-sample interaction using complete measurements of the input of the cantilever and its measured deflection. Two methods are...