Searched for: subject%3A%22Reflectance%22
(1 - 1 of 1)
document
de Almeida Nieto, L.M. (author), Gabrieli, Francesca (author), van Loon, A. (author), Gonzalez, Victor (author), Dik, J. (author), Van de Plas, Raf (author), Alfeld, M.W.E.M. (author)
Macroscopic x-ray fluorescence imaging spectroscopy (MA-XRF) and reflectance imaging spectroscopy (RIS) are important tools in the analysis of cultural heritage objects, both for conservation and art historical research purposes. The elemental and molecular distributions provided by MA-XRF and RIS respectively, are particularly useful for the...
journal article 2023