Searched for: subject%3A%22Semiconductor%255C%252Bdevice%255C%252Bmeasurement%22
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Meijer, E.J. (author), Gelinck, G.H. (author), Van Veenendaal, E. (author), Huisman, B.H. (author), De Leeuw, D.M. (author), Klapwijk, T.M. (author)
The scaling behavior of the transfer characteristics of solution-processed disordered organic thin-film transistors with channel length is investigated. This is done for a variety of organic semiconductors in combination with gold injecting electrodes. From the channel-length dependence of the transistor resistance in the conducting ON-state, we...
journal article 2003
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Khan, R.U.A. (author), Silva, S.R.P. (author), Van Swaaij, R.A.C.M.M. (author)
Amorphous carbon (a-C) has been shown to be intrinsically p-type, and polymeric a-C (PAC) possesses a wide Tauc band gap of 2.6 eV. We have replaced the p-type amorphous silicon carbide layer of a standard amorphous silicon solar cell with an intrinsic ultrathin layer of PAC. The thickness of the p layer had to be reduced from 9 to 2.5 nm in...
journal article 2003