Kouwenberg, J.J.M. (author), Kremers, G. J. (author), Slotman, J. A. (author), Wolterbeek, H.T. (author), Houtsmuller, A.B. (author), Denkova, A.G. (author), bos, A.J.J. (author) Structured illumination microscopy (SIM) for the imaging of alpha particle tracks in fluorescent nuclear track detectors (FNTD) was evaluated and compared to confocal laser scanning microscopy (CLSM). FNTDs were irradiated with an external alpha source and imaged using both methodologies. SIM imaging resulted in improved resolution, without...
journal article 2018
