Searched for: subject%3A%22Silicon%22
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document
Legerstee, W.J. (author), Noort, T. (author), van Vliet, T. K. (author), Schut, H. (author), Kelder, E.M. (author)
Here we present Positron Annihilation Doppler Broadening Spectroscopy (PADBS) as a powerful method to analyse the origin and development of defect processes in porous silicon structures as a result of alloying with lithium for the use in battery anode applications. Several prepared anodes were lithiated (discharged against Li<sup>+</sup>/Li)...
journal article 2022
document
Legerstee, W.J. (author), Boekel, M.G.M. (author), Boonstra, S. (author), Kelder, E.M. (author)
An Atomic Force Microscope (AFM) is combined with a special designed glovebox system and coupled to a Galvanostat/Potentiostat to allow measurements on electrochemical properties for battery research. An open cell design with electrical contacts makes it possible to reach the electrode surface with the cantilever so as to perform measurements...
journal article 2021
document
Vons, V.A. (author), De Smet, L.C.P.M. (author), Munao, D. (author), Evirgen, A. (author), Kelder, E.M. (author), Schmidt-Ott, A. (author)
On the example of silicon, the production of nanoparticles using spark discharge is shown to be feasible for semiconductors. The discharge circuit is modelled as a damped oscillator circuit. This analysis reveals that the electrode resistance should be kept low enough to limit energy loss by Joule heating and to enable effective nanoparticle...
journal article 2011
document
Goossens, A. (author), Kelder, E.M. (author), Schoonman, J. (author)
conference paper 1990
Searched for: subject%3A%22Silicon%22
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