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van Hulzen, M. (author), Ooms, F.G.B. (author), Wright, Jonathan P. (author), Wagemaker, M. (author)
For the development of next-generation batteries it is important to understand the structural changes in electrodes under realistic non-equilibrium conditions. With microbeam X-ray diffraction it is possible to probe many individual electrode grains concurrently under non-equilibrium conditions in realistic battery systems. This makes it...
journal article 2018
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Nervo, L. (author), King, A. (author), Wright, J.P. (author), Ludwig, W. (author), Reischig, P. (author), Quinta da Fonseca, J. (author), Preuss, M. (author)
A comparison of the performance of X-ray diffraction tomography, a near-field diffraction technique, and a far-field diffraction technique for indexing X-ray diffraction data of polycrystalline materials has been carried out by acquiring two sets of diffraction data from the same polycrystalline sample volume. Both approaches used in this study...
journal article 2014