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Chaudhary, A. (author), Hos, Jan (author), Lossen, Jan (author), Huster, Frank (author), Kopecek, Radovan (author), van Swaaij, R.A.C.M.M. (author), Zeman, M. (author)
In this article, we investigate the passivation quality and electrical contact properties for samples with a 150 nm thick n+ polysilicon layer in comparison to samples with a phosphorus diffused layer. High level of passivation is achieved for the samples with n+ polysilicon layer and an interfacial oxide underneath it. The contact properties...
journal article 2022
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van Schelven, R.M. (author), Fiorellini Bernardis, A. (author), Sberna, P.M. (author), Neto, A. (author)
Semiconductor (SC)-based bulk absorbers operating in the (sub-) THz range are discussed. The conductivities of the bulk media are described by the Drude model for electron gas where the electron density is controlled. The Drude model predicts the existence of two frequencies of interest: one associated with the scattering time of the electrons...
journal article 2021