Bias-dependent contact resistance in rubrene single-crystal field-effect transistors

The authors report a systematic study of the bias-dependent contact resistance in rubrene single-crystal field-effect transistors with Ni, Co, Cu, Au, and Pt electrodes. They show that the reproducibility in the values of contact resistance strongly depends on the metal, ranging from a factor of 2 for Ni to more than three orders of magnitude...

Electrical transport in monolayers of phthalocyanine molecular wires and AFM imaging of a single wire bridging two electrodes