Charge deep-level transient spectroscopy study of high-energy-electron-beam-irradiated hydrogenated amorphous silicon

We present a study of changes in the defect density of states in hydrogenated amorphous silicon (a-Si:H) due to high-energy electron irradiation using charged deep-level transient spectroscopy. It was found that defect states near the conduction band were removed, while in other band gap regions the defect-state density increased. A similar...

Temperature dependent spectroscopic studies of the electron delocalization dynamics of excited Ce ions in the wide band gap insulator, Lu2SiO5

Electron delocalization processes of optically excited states of Ce3+ impurities in Lu2SiO5 were investigated by means of a temperature and spectrally resolved photoconductivity study. By monitoring separately the strength of the photocurrent resulting from excitation into each of the Ce3+?5d absorption bands, over a broad temperature region,...