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van Sebille, M. (author), Allebrandi, J.S. (author), Quik, J. (author), van Swaaij, R.A.C.M.M. (author), Tichelaar, F.D. (author), Zeman, M. (author)
We demonstrate an analytical method to optimize the stoichiometry and thickness of multilayer silicon oxide films in order to achieve the highest density of non-touching and closely spaced silicon nanocrystals after annealing. The probability of a nanocrystal nearest-neighbor distance within a limited range is calculated using the...
journal article 2016