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Sun, B. (author), Fan, J. (author), Fan, Xuejun (author), Zhang, Kouchi (author), Zhang, Guohao (author)In this paper, a physics of failure-based prediction method is combined with statistical models to consider the impact of current crowding and current droop effects on the reliability of LED arrays. Electronic-thermal models of LEDs are utilized to obtain the operation conditions under the influences of current crowding and current droop. A...journal article 2019
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Ibrahim, M.S. (author), Fan, J. (author), Yung, Winco K.C. (author), Wu, Zeyu (author), Sun, B. (author)Nowadays, due to the advancement of design and manufacturing technology, there are many consumer products with high reliability. Similarly, the competition in the business sector influences the product development time to become shorter and that makes it difficult for manufacturers to evaluate the reliability of current products before new...journal article 2019
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Sun, Bo (author), Fan, Xuejun (author), van Driel, W.D. (author), Cui, Chengqiang (author), Zhang, Kouchi (author)In this study, we present a general methodology that combines the reliability theory with physics of failure for reliability prediction of an LED driver. More specifically, an integrated LED lamp, which includes an LED light source with statistical distribution of luminous flux, and a driver with a few critical components, is considered. The...journal article 2018
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Sun, B. (author), Fan, J. (author), Fan, Xuejun (author), Zhang, Kouchi (author)This work studies the effect of randomness of LED's lumen depreciation on reliability of the entire LED lamp. An integrated LED light bulb is selected as carrier of the proposed method. A PoF based lumen depreciation model and electronic-thermal simulations are introduced for reliability prediction. The normal distribution is used to describe...conference paper 2018
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Santagata, F. (author), Sun, J. (author), Iervolino, E. (author), Yu, H. (author), Wang, F. (author), Zhang, Kouchi (author), Sarro, Pasqualina M (author), Zhang, Guoyi (author)Purpose: The purpose of this paper is to demonstrate a novel 3D system-in-package (SiP) approach. This new packaging approach is based on stacked silicon submount technology. As demonstrators, a smart lighting module and a sensor systems were successfully developed by using the fabrication and assembly process described in this paper. Design...journal article 2018
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Sun, B (author), Fan, Xuejun (author), Zhang, Kouchi (author)This chapter investigates the reliability of the integrated LED lamps with electrolytic capacitor-less LED drivers. Firstly, the impact of the interaction between the degradations of the LED light source and the driver on the lumen depreciation is studied. The electronic-thermal simulation was carried out to obtain the history of temperatures of...book chapter 2018
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Sun, B. (author)Light-Emitting Diodes (LEDs) have become a very promising alternative lighting source with the main advantages of a longer lifetime and a higher efficiency than traditional ones. However, the LED lamp’s lifetime is compromised by its driver’s reliability. Although extensive studies have been made on the reliability of LEDs, the research on the...doctoral thesis 2017
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Sun, B. (author), Fan, Xuejun (author), Ye, H. (author), Fan, Jiajie (author), Qian, Cheng (author), van Driel, W.D. (author), Zhang, Kouchi (author)In this paper, an integrated LED lamp with an electrolytic capacitor-free driver is considered to study the coupling effects of both LED and driver's degradations on lamp's lifetime. An electrolytic capacitor-less buck-boost driver is used. The physics of failure (PoF) based electronic thermal simulation is carried out to simulate the lamp's...journal article 2017
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Sun, B. (author), Fan, Xuejun (author), Li, Lei (author), Ye, H. (author), van Driel, W.D. (author), Zhang, Kouchi (author)This paper studies the interaction of catastrophic failure of the driver and LED luminous flux decay for an integrated LED lamp with an electrolytic capacitor-free LED driver. Electronic thermal simulations are utilized to obtain the lamp's dynamic history of temperature and current for two distinct operation modes: constant current mode (CCM...journal article 2017
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Sun, B. (author), Fan, Xuejun (author), Fan, J. (author), Zhang, Kouchi (author), Qian, Cheng (author)In this work, a physics-of-failure (PoF) reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and catastrophic failures of LEDs. The current in each LED may redistribute when the catastrophic failure occurs in one of LEDs in an array, thus affecting the operation...conference paper 2017