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4D-STEM Nanoscale Strain Analysis in van der Waals Materials: Advancing beyond Planar ConfigurationsBolhuis, M. (author), van Heijst, S.E. (author), Sangers, J.J.M. (author), Conesa Boj, S. (author)Achieving nanoscale strain fields mapping in intricate van der Waals (vdW) nanostructures, like twisted flakes and nanorods, presents several challenges due to their complex geometry, small size, and sensitivity limitations. Understanding these strain fields is pivotal as they significantly influence the optoelectronic properties of vdW...journal article 2024