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Eijt, S.W.H. (author), Kind, R. (author), Singh, S. (author), Schut, H. (author), Legerstee, W.J. (author), Hendrikx, R.W.A. (author), Svetchnikov, V.L. (author), Westerwaal, R.J. (author), Dam, B. (author)We report positron depth-profiling studies on the hydrogen sorption behavior and phase evolution of Mg-based thin films. We show that the main changes in the depth profiles resulting from the hydrogenation to the respective metal hydrides are related to a clear broadening in the observed electron momentum densities in both Mg and Mg2Ni films....journal article 2009
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Faradzhev, N. (author), Sidorkin, V. (author)The authors report on the interaction of atomic hydrogen with Sn and thin Ru film at room temperature. The study is done using a combination of photoelectron and low energy ion scattering spectroscopies as well as scanning electron microscopy. The adsorption of hydrogen on a Sn surface leads to the formation of stannane (SnH4), which...journal article 2009
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Heersche, H.B. (author), Lientschnig, G. (author), O'Neill, K. (author), Van der Zant, H.S.J. (author), Zandbergen, H.W. (author)The authors imaged electromigration-induced nanogap formation in situ by transmission electron microscopy. Real-time video recordings show that edge voids form near the cathode side. The polycrystalline gold wires narrow down until a single-grain boundary intersects the constriction along which the breaking continues. During the last 50?ms of...journal article 2007
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Grachev, S.Y. (author), Tichelaar, F.D. (author), Janssen, G.C.A.M. (author)We studied the tensile stress and grain-width evolution in sputter-deposited Cr films with thickness from 20?nm to 2.7??m. Films were deposited in an industrial Hauzer 750 physical vapor deposition machine at 50–80?°C. The films exhibited a columnar microstructure. A power law behavior of the tensile stress as well as of the average grain width...journal article 2005