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Lane, R. (author), Vos, Y. (author), Wolters, A.E. (author), van Kessel, L.C.P.M. (author), Chen, S. Elisa (author), Liv, Nalan (author), Klumperman, Judith (author), Giepmans, Ben N.G. (author), Hoogenboom, J.P. (author)Large-scale electron microscopy (EM) allows analysis of both tissues and macromolecules in a semi-automated manner, but acquisition rate forms a bottleneck. We reasoned that a negative bias potential may be used to enhance signal collection, allowing shorter dwell times and thus increasing imaging speed. Negative bias potential has previously...journal article 2021
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Storm, A.J. (author), Chen, J.H. (author), Ling, X.S. (author), Zandbergen, H.W. (author), Dekker, C. (author)The imaging beam of a transmission electron microscope can be used to fine tune critical dimensions in silicon oxide nanostructures. This technique is particularly useful for the fabrication of nanopores with single-nanometer precision, down to 2 nm. We report a detailed study on the effect of electron-beam irradiation on apertures with various...journal article 2005
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- Chen, C.H. (author), Buysman, A.A.J. (author), Kelder, E.M. (author), Schoonman, J. (author) journal article 1995