Positioning Pd catalyst particles for carbon nanotube growth using charge patterns created with a scanning electron microscope

Positioning of charged nanoparticles with the help of charge patterns in an insulator substrate is a known method. However, the creation of charge patterns with a scanning electron microscope for this is relatively new. Here a scanning electron microscope is used for the creation of localized charge patterns in an insulator, while a glowing wire...

Imaging of charge trapping in distorted carbon nanotubes by x-ray excited scanning probe microscopy

We have observed the distribution of electron trapping centers on distorted carbon nanotubes (CNTs) by a unique x-ray analysis technique that has both elemental and spatial selectivities. This technique involves the use of scanning probe microscopy (SPM) under synchrotron radiation excitation of the inner shell of carbon. The probe detects the...

Scanning tunneling spectroscopy of suspended single-wall carbon nanotubes

We have performed low-temperature scanning tunneling microscopy measurements on single-wall carbon nanotubes that are freely suspended over a trench. The nanotubes were grown by chemical vapor deposition on a Pt substrate with predefined trenches etched into it. Atomic resolution was obtained on the freestanding portions of the nanotubes....

Length control of individual carbon nanotubes by nanostructuring with a scanning tunneling microscope