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Beekers, D.I. (author), Mastik, Frits (author), Beurskens, Robert (author), Tang, Phoei Ying (author), Vegter, Merel (author), van der Steen, A.F.W. (author), de Jong, N. (author), Verweij, M.D. (author), Kooiman, Klazina (author)Ultrasound insonification of microbubbles can locally enhance drug delivery, but the microbubble–cell interaction remains poorly understood. Because intracellular calcium (Ca<sub>i</sub> <sup>2+</sup>) is a key cellular regulator, unraveling the Ca<sub>i</sub> <sup>2+</sup> fluctuations caused by an oscillating microbubble provides crucial...journal article 2020
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Beekers, D.I. (author), Lattwein, Kirby R. (author), Kouijzer, Joop J.P. (author), Langeveld, Simone A.G. (author), Vegter, M. (author), Beurskens, Robert (author), Mastik, F. (author), Verduyn Lunel, Rogier (author), van der Steen, A.F.W. (author), de Jong, N. (author)Controlling microbubble-mediated drug delivery requires the underlying biological and physical mechanisms to be unraveled. To image both microbubble oscillation upon ultrasound insonification and the resulting cellular response, we developed an optical imaging system that can achieve the necessary nanosecond temporal and nanometer spatial...journal article 2019
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Mozaffarzadeh, M. (author), Varnosfaderani, Mehdi H.H. (author), Sharma, Arunima (author), Pramanik, Manojit (author), de Jong, N. (author), Verweij, M.D. (author)In acoustic-resolution photoacoustic microscopy (AR-PAM) systems, the lateral resolution in the focal zone of the ultrasound (US) transducer is determined by the numerical aperture (NA) of the transducer. To have a high lateral resolution, a large NA is used. However, the larger the NA, the smaller the depth of focus [DOF]. As a result, the...journal article 2019
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van der Walle, P (author), Kramer, E. (author), van der Donck, J.C.J. (author), Mulckhuyse, W (author), Nijsten, L. (author), Bernal Arango, F.A. (author), de Jong, A. (author), van Zeijl, E. (author), Spruit, H. E.T. (author), van den Berg, J.H. (author), Nanda, G. (author), van Langen-Suurling, A.K. (author), Alkemade, P.F.A. (author), Pereira, S.F. (author), Maas, D.J. (author)Particle defects are important contributors to yield loss in semi-conductor manufacturing. Particles need to be detected and characterized in order to determine and eliminate their root cause. We have conceived a process flow for advanced defect classification (ADC) that distinguishes three consecutive steps; detection, review and...conference paper 2017
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- Mulvana, Helen (author), Browning, Richard J. (author), Luan, Ying (author), de Jong, N. (author), Tang, Meng-Xing (author), Eckersley, Robert J. (author), Stride, Eleanor (author) journal article 2017