In situ TEM and STEM studies of reversible electromigration in thin palladium–platinum bridges

We investigated the reversible electromigration in Pd–Pt nanobridges by means of in situ electron microscopy. Real-time nanometer-scale imaging with scanning transmission electron microscopy was used to determine the material transport. For high current densities (3–5 × 107 A cm?2), material transport occurs from the cathode towards the anode...