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Scorticati, D. (author), Illiberi, A. (author), Bor, T. (author), Eijt, S.W.H. (author), Schut, H. (author), Römer, G.R.B.E. (author), De Lange, D.F. (author), Huis in 't Veld, A.J. (author)Post-deposition annealing by ultra-short laser pulses can modify the optical properties of SnO2 thin films by means of thermal processing. Industrial grade SnO2 films exhibited improved optical properties after picosecond laser irradiation, at the expense of a slightly increased sheet resistance [Proc. SPIE 8826, 88260I (2013)]. The figure of...journal article 2014
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Hermosa, N. (author), Rosales-Guzman, C. (author), Pereira, S.F. (author), Torres, J.P. (author)We demonstrate an optical scheme for measuring the thickness of thin nanolayers with the use of light beam’s spatial modes. The novelty in our scheme is the projection of the beam reflected by the sample onto a properly tailored spatial mode. In the experiment described below, we are able to measure a step height smaller than 10 nm, i.e., one...journal article 2014