Low power IC design characterization techniques under process variations

To overcome the increasing sensitivity to variability in nanoscale integrated circuits, operation parameters (e.g., supply voltage) are adapted in a customized way exclusively to each chip. AVS is a standard industrial technique which has been adopted widely to compensate for process, voltage, and temperature variations as well as power...

On the worst-case complexity of the gradient method with exact line search for smooth strongly convex functions

We consider the gradient (or steepest) descent method with exact line search applied to a strongly convex function with Lipschitz continuous gradient. We establish the exact worst-case rate of convergence of this scheme, and show that this worst-case behavior is exhibited by a certain convex quadratic function. We also give the tight worst-case...