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van der Reep, T.H.A. (author), Looman, B.A. (author), Chan, H.W. (author), Hagen, C.W. (author), van der Graaf, H. (author)We measure the transmission secondary electron yield of nanometer-thick Al2O3/TiN/Al2O3 films using a prototype version of a Timed Photon Counter (TiPC). We discuss the method to measure the yield extensively. The yield is then measured as a function of landing energy between 1.2 and 1.8 keV and found to be in the range of 0.1 (1.2 keV) to 0.9 ...journal article 2020
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Tao, Shu Xia (author), Chan, H.W. (author), van der Graaf, H. (author)Secondary electron emission materials are reviewed with the aim of providing guidelines for the future development of novel transmission dynodes. Materials with reflection secondary electron yield higher than three and transmission secondary electron yield higher than one are tabulated for easy reference. Generations of transmission dynodes...journal article 2016