Searched for: subject%3A%22process%22
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Van Spengen, W.M. (author)
In this paper a model is presented that describes the distribution of adhesion values typically experimentally observed for different MEMS devices that have been fabricated in the same way. This spread is attributed to the fact that different devices differ in the details of their surface roughness, even if these surface roughnesses are modeled...
journal article 2015
document
Van der Burg, D. (author), Verdel, A. (author), Wapenaar, C.P.A. (author)
Trace inversion for reservoir parameters is affected by angle averaging of seismic data and wavelet distortion on the migration image. In an alternative approach to stochastic trace inversion, the data are inverted prestack before migration using 3D dynamic ray tracing. This choice makes it possible to interweave trace inversion with Kirchhoff...
journal article 2009
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Hagen, C.W. (author), Fokkema, E. (author), Kruit, P. (author)
The virtual source size of a liquid metal ion source is an order of magnitude larger than the size of the region from which the ions are emitted at the source. This source size has a direct effect on the reduced brightness and, hence, on the performance of these sources. The variation of the virtual source size of a gallium liquid metal ion...
journal article 2008
document
Van Aert, S. (author), Van Dyck, D. (author), Den Dekker, A.J. (author)
The resolution of coherent and incoherent imaging systems is usually evaluated in terms of classical resolution criteria, such as Rayleigh’s. Based on these criteria, incoherent imaging is generally concluded to be ‘better’ than coherent imaging. However, this paper reveals some misconceptions in the application of the classical criteria, which...
journal article 2006
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