Improving CubeSat reliability: Subsystem redundancy or improved testing?

The objective of this paper is to investigate which approach would lead to more reliable CubeSats: full subsystem redundancy or improved testing. Based on data from surveys, the reliability of satellites and subsystems is estimated using a Kaplan–Meier estimator. Subsequently, a variety of reliability models is defined and their maximum...

Reliability Modeling Considerations for Emerging Cyber–Physical Power Systems: Prepared by Task Force on Reliability Consideration for Emerging Cyber-Physical Energy Systems under IEEE PES Reliability, Risk and Probability Applications Subcommittee

Power system operation considering an increasingly complex cyber infrastructure may be one of the key factors of the next generation power systems. The effective operation of a power system in a massively deployed cyber network environment will be affected by cyber network reliability. Therefore, it is vital not only to understand the operation...

Vulnerability of industrial plants to flood-induced natechs: A Bayesian network approach

In the context of natural-technological (natech) accidents, flood-induced damage of industrial plants have received relatively less attention mainly due to the scarcity of such accidents compared to those triggered by earthquakes, high winds, and lightnings. The large amount of oil spillage due to floods triggered by the Hurricanes Katrina and...

Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing

The color coordinate shift of light-emitting diode (LED) lamps is investigated by running three stress-loaded testing methods, namely step-up stress accelerated degradation testing, step-down stress accelerated degradation testing, and constant stress accelerated degradation testing. A power model is proposed as the statistical model of the...

Fault-tolerant architectures for nanoelectronic and quantum devices

The progress in CMOS technology has entered the sub-micron realm, and the technology will approach its limits within about 15 years. Already various novel information processing devices, based on quantum mechanical effects at the nanometer scale, have been widely investigated and some have been successfully demonstrated at the circuit level....

Models and Algorithms for Automatic Reliability Assessment of Complex Systems