Searched for: subject%3A%22semiconductor%255C+device%255C+models%22
(1 - 9 of 9)
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Li, Shizhen (author), Liu, X. (author), Gao, Chenshan (author), Wang, S. (author), Li, Jun (author), Ye, Huaiyu (author), Zhang, Kouchi (author), Wu, Shaohui (author)
The significance of wafer bonding is fundamental to the progression of electronic systems. Common fabrication techniques for Cu pillars play a crucial role in establishing resilient and efficient interconnects within semiconductor devices. It is imperative to explore the potential of nano-copper as an alternative material to overcome limitations...
conference paper 2024
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Qian, Yichen (author), Hou, F. (author), Fan, J. (author), Lv, Quanya (author), Fan, X. (author), Zhang, Kouchi (author)
A new panel-level silicon carbide (SiC) metal oxide semiconductor field effect transistor (MOSFET) power module was developed by using the fan-out and embedded chip technologies. To achieve the more effective thermal management and higher reliability under thermal cycling, a new optimization method called Ant colony optimization-back...
journal article 2021
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Procel Moya, P.A. (author), Yang, G. (author), Isabella, O. (author), Zeman, M. (author)
This paper presents an analysis of physical mechanisms related to operation and optimization of interdigitated back contact (IBC) poly-silicon-based devices. Concepts of carrier selectivity and tunneling are used to identify the parameters that impact on the fill factor. Then, based on technology computer-aided design (TCAD) numerical...
journal article 2019
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Incandela, R.M. (author), Song, L (author), Homulle, Harald (author), Charbon-Iwasaki-Charbon, E. (author), Vladimirescu, A. (author), Sebastiano, F. (author)
Cryogenic characterization and modeling of two nanometer bulk CMOS technologies (0.16-μm and 40-nm) are presented in this paper. Several devices from both technologies were extensively characterized at temperatures of 4 K and below. Based on a detailed understanding of the device physics at deep-cryogenic temperatures, a compact...
journal article 2018
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Zjajo, Amir (author), van Leuken, T.G.R.M. (author)
In this paper, we propose an efficient methodology based on a real-time estimator and predictor-corrector scheme for accurate thermal expansion profile and aging evaluation of a neuromorphic signal processor circuit components. As the experimental results indicate, for comparable mesh size, the proposed method is 1~2 order of magnitude more...
conference paper 2016
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Popadic, M. (author), Lorito, G. (author), Nanver, L.K. (author)
For the first time, an analytical model of arbitrarily shallow p-n junctions is presented. Depending on the junction depth, electrical characteristics of ultrashallow p-n junctions can vary from the characteristics of standard Schottky diodes to standard deep p-n junctions. This model successfully unifies the standard Schottky and p-n diode...
journal article 2008
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Yan, F. (author), Migliorato, P. (author), Ishihara, R. (author)
The influence of twin boundaries on the characteristics of single grain-silicon thin film transistors has been analyzed by three-dimensional simulation. The simulations show that the orientation and the location of a twin boundary could affect the field-effect mobility and the leakage current of a device. The field-effect mobility increases with...
journal article 2007
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Mas-Torrent, M. (author), Hadley, P. (author), Bromley, S.T. (author), Crivillers, N. (author), Veciana, J. (author), Rovira, C. (author)
We report on the fabrication and characterization of field-effect transistors based on single crystals of the organic semiconductor dibenzo-tetrathiafulvalene (DB-TTF). We demonstrate that it is possible to prepare very-good-quality DB-TTF crystals from solution. These devices show high field-effect mobilities typically in the range 0.1–1?cm2/V...
journal article 2004
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Zhang, L.X. (author), Leburton, J.P. (author), Hanson, R. (author), Kouwenhoven, L.P. (author)
We show that the design of a quantum point contact adjacent to a quantum dot can be optimized to produce maximum sensitivity to single-electron charging in the quantum dot. Our analysis is based on the self-consistent solution of coupled three-dimensional Kohn-Sham and Poisson equations for the quantum circuit. We predict a detection sensitivity...
journal article 2004
Searched for: subject%3A%22semiconductor%255C+device%255C+models%22
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