Rapid Design-Space Exploration for Low-Power Manycores under Process Variation utilizing Machine Learning

Design-space exploration for low-power manycore design is a daunting and time-consuming task which requires some complex tools and frameworks to achieve. In the presence of process variation, the problem becomes even more challenging, especially the time associated with trial-and-error selection of the proper options in the tools to obtain the...

MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design

The popularity of perpendicular magnetic tunnel junction (pMTJ)-based spin-transfer torque magnetic random access memories (STT-MRAMs) is growing very fast. The performance of such memories is very sensitive to magnetic fields, including both internal and external ones. This article presents a magnetic-field-aware compact model of pMTJ, named...

Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes

SRAM Physical Unclonable Functions (PUFs) are among other things today commercially used for secure primitives such as key generation and authentication. The quality of the PUFs and hence the security primitives, depends on intrinsic variations which are technology dependent. Therefore, to sustain the commercial usage of PUFs for cutting-edge...

MNEMOSENE: Tile Architecture and Simulator for Memristor-based Computation-in-memory

In recent years, we are witnessing a trend toward in-memory computing for future generations of computers that differs from traditional von-Neumann architecture in which there is a clear distinction between computing and memory units. Considering that data movements between the central processing unit (CPU) and memory consume several orders...

Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs

The development of Integrated Circuits for the Automotive sector imposes on major challenges. ISO26262 compliance, as part of this process, entails complex analysis for the evaluation of potential random hardware faults. This paper proposes a systematic approach to identify faults that do not disrupt safety-critical functionalities and...

Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification

The development of Integrated Circuits for the Automotive sector imposes on complex challenges. ISO26262 Functional Safety requirements entail extensive Fault Injection campaigns and complex analysis for the evaluation of deployed Software Tools. This paper proposes a methodology to improve Fault Analysis Tools Confidence Level (TCL) by...

Efficient Methodology for ISO26262 Functional Safety Verification

Tolerance to random hardware failures, required by ISO26262, entails accurate design behavior analysis, complex Verification Environments and expensive Fault Injection campaigns. This paper proposes a methodology combining the strengths of Automatic Test Pattern Generators (ATPG), Formal Methods and Fault Injection Simulation to decrease the...

Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era

In this paper, we study the impact of the idle/dynamic power consumption ratio on the effectiveness of a multi-V _dd /frequency manycore design. We propose a new tool called LVSiM (a Low-Power and Variation-Aware Manycore Simulator) to carry out the experiments. It is a novel manycore simulator targeted towards low-power...

Use of Formal Methods for verification and optimization of Fault Lists in the scope of ISO26262

This work aims at an alternative method to verify the correctness of Fault Lists generated by fault simulators tools in context of safety verification. The lists generated by simulation tools are verified against lists from formal tools. The consistency evaluation between the lists supports the Tool Confidence Level (TCL) assessment, defined in...

Testing multi-port memories: Theory and practice