The goal of creep fatigue modelling is the compounding of the damage caused by creep and fatigue mechanisms. The different approaches for compounding these damage mechanisms have led to several different creep fatigue models: (i) ignore fatigue damage — the creep ductility (energy density) exhaustion models; (ii) lumping plastic and creep strain (energy) into inelastic strain (energy) — the model of Dauvearx's crack initiation and propagation; (iii) linearly sum fatigue and creep damage — the model of linear damage summation; (iv) model creep and fatigue damage using a common parameter — the models of fracture mechanics; (v) partition damage into fatigue, cyclic creep, and cyclic creep-fatigue interaction — strain range/energy partitioning models; (vi) model creep and fatigue damage using a common parameter at rates that are dependent on the current state of damage — the model unified damage; (vii) model creep and fatigue damage using separate damage parameters — the mechanism based model; and (viii) integrate creep damage into the fatigue equation — creep modified strain-life equations. The rigour of the approaches increases from (i) to (vii). The creep modified strain-life equation requires no evaluation of creep strain and facilitates design analysis and evaluation of acceleration factors; however, its rigour depends on the choice of the creep functions. The unified equation is capable of covering the full spectrum of creep-fatigue from pure fatigue to pure creep rupture.@en

With the expanding application of light-emitting diodes (LEDs), the color quality of white LEDs has attracted much attention in several color-sensitive application fields, such as museum lighting, healthcare lighting and displays. Reliability concerns for white LEDs are changing from the luminous efficiency to color quality. However, most of the current available research on the reliability of LEDs is still focused on luminous flux depreciation rather than color shift failure. The spectral power distribution (SPD), defined as the radiant power distribution emitted by a light source at a range of visible wavelength, contains the most fundamental luminescence mechanisms of a light source. SPD is used as the quantitative inference of an LED's optical characteristics, including color coordinates that are widely used to represent the color shift process. Thus, to model the color shift failure of white LEDs during aging, this paper first extracts the features of an SPD, representing the characteristics of blue LED chips and phosphors, by multi-peak curve-fitting and modeling them with statistical functions. Then, because the shift processes of extracted features in aged LEDs are always nonlinear, a nonlinear state-space model is then developed to predict the color shift failure time within a self-adaptive particle filter framework. The results show that: (1) the failure mechanisms of LEDs can be identified by analyzing the extracted features of SPD with statistical curve-fitting and (2) the developed method can dynamically and accurately predict the color coordinates, correlated color temperatures (CCTs), and color rendering indexes (CRIs) of phosphor-converted (pc)-white LEDs, and also can estimate the residual color life@en