We present a phase and amplitude beam pattern measurement technique using harmonic mixers. This allows a simultaneous multi-frequency phase sensitive characterization of a low resolution and wideband (220-420GHz) on-chip spectrometer using microwave kinetic inductance detectors. We investigate the beam quality, in particular the beam pointing and inferred telescope coupling and hence aperture efficiency. The measurements match the goal requirements for the DESHIMA-2 instrument for the ASTE telescope. The technique would be of interest for any (direct detector) spectrometer with a wide instantaneous bandwidth, particularly ones with dispersive components.