Specular light reflections are the mirror-like reflections from a material interface. They appear in the observation of any illuminated surface. Specular reflections can be set apart from the diffuse reflection type, which has a random distribution of reflection directions. The radiance of the specular reflected light is governed by the Fresnel ratio and depends on both geometrical and spectral properties. A clear distinction can be made between the reflection properties of dielectric and the much more reflective non-dielectric material types. In certain cases the presence of specular reflections is useful, for example in object identification or computer graphics applications. However, often the presence of specular reflection causes bright spots on the image of an object, which results in loss of detail in these areas. Particularly in computer vision applications it is important to only observe the intrinsic diffuse reflection. Hence, a variety of specular reflection removal methods have been developed. Color-space analysis specular reflection removal methods are able to accurately recover the intrinsic diffuse color of the image of an object. Optimization based methods based on a non-negative matrix factorization of the data are considered. The reduced characteristic representation of the data allows the specular and diffuse reflection component to be separated more easily. A multi-image approach is considered because it provides more available information on the intrinsic diffuse reflection component, which is typically a relatively weak signal for non-dielectric surface reflections. A specular reflection removal method is developed, that combines a new reflection model for colored illumination with a sparse Non-negative Matrix Factorization (NMF) optimization in a multi-image framework. The proposed method is evaluated on synthetic data and real data images of non-dielectric materials acquired conform the proposed reflection model.