JN

Jacques Noom

Authored

10 records found

Phase retrieval from overexposed PSF

A projection-based approach

We investigate the general adjustment of projection-based phase retrieval algorithms for use with saturated data. In the phase retrieval problem, model fidelity of experimental data containing a non-zero background level, fixed pattern noise, or overexposure, often presents a ser ...
This manuscript presents an improvement of state-of-the-art Closed-Loop Active Model Diagnosis (CLAMD). The proposed method utilizes weighted Bhattacharyya coefficients evaluated at the vertices of the polytopic constraint set to provide a good trade-off between computational eff ...

We propose to use the State Estimation by Sum-of-Norms Regularisation (STATESON-)algorithm for recovering the tip-sample interaction in high-speed tapping mode atomic force microscopy (AFM). This approach enables accurate sample height estimation for each independent cantileve ...

Some applications require high level of image-based classification certainty while keeping the total illumination energy as low as possible. Examples are minimally invasive visual inspection in Industry 4.0, and medical imaging systems such as computed tomography, in which the ra ...
We demonstrate a novel closed-loop input design technique on the detection of particles in an imaging system such as a fluorescence microscope. The probability of misdiagnosis is minimized while constraining the input energy such that for instance phototoxicity is reduced. The ke ...
The complexity of automated systems has grown considerably during the past decades. This convolutes the observation of possible faults in these systems. If not being revealed timely, such faults can lead to catastrophic failures. As a result, there is a continuous interest in sop ...
Model-based fault diagnosis for dynamical systems is a sophisticated task due to model inaccuracies, measurement noise and many possible fault scenarios. By presenting faults in terms of a dictionary, the latter obstacle is recently addressed using well-known techniques for recov ...

Model-based fault diagnosis for dynamical systems is a sophisticated task due to model inaccuracies, measurement noise and many possible fault scenarios. By presenting faults in terms of a dictionary, the latter obstacle is recently addressed using well-known techniques for re ...

Model-based fault diagnosis for dynamical systems is a sophisticated task due to model inaccuracies, measurement noise and many possible fault scenarios. By presenting faults in terms of a dictionary, the latter obstacle is recently addressed using well-known techniques for re ...

We present a novel problem formulation for model-free data-driven fault diagnosis, in which possible faults are diagnosed simultaneously to identifying the linear time-invariant system. This problem is practically relevant for systems whose model cannot be identified reliably ...

Contributed

4 records found

Identifying Linear Parameter- Varying State Space Models

Estimating System Dynamics and Scheduling Variables From State Sequences and Input-Output Measurements

Linear Parameter-Varying (LPV) systems can be used as a bridge to extend the well studied model based control methods of Linear Time-Invariant systems to certain nonlinear systems. Despite significant attention in literature over the last two decades, finding an efficient global ...

Blind Fault Identification of Air Data Sensors

Data-driven Approach to Fault Diagnosis

Model-based fault diagnosis methodologies rely on an accurate mathematical representation of a system's dynamics to effectively detect and localize faults. However, creating such models can be challenging, particularly for complex systems operating under diverse conditions. Furth ...
Specular light reflections are the mirror-like reflections from a material interface. They appear in the observation of any illuminated surface. Specular reflections can be set apart from the diffuse reflection type, which has a random distribution of reflection directions. The r ...
High-Speed Atomic Force Microscopy is widely used for investigating biological architectures and the semiconductor industry. The main limitation comes from parachuting or the Wile E. Coyote effect. Parachuting is the phenomenon where the cantilever taps on the sample towards a st ...