We present a novel problem formulation for model-free data-driven fault diagnosis, in which possible faults are diagnosed simultaneously to identifying the linear time-invariant system. This problem is practically relevant for systems whose model cannot be identified reliably prior to diagnosing possible faults, for instance when operating conditions change over time, when a fault is already present before system identification is carried out, or when the system dynamics change due to the presence of the fault. A computationally attractive solution is proposed by solving the problem using unconstrained convex optimization, where the objective function consists of three terms of which two are non-differentiable. An additional recursive implementation based on a proximal algorithm is presented in order to solve the optimization problem online. The numerical results on a buck converter show the application of the proposed solution both offline and online.

This paper addresses the key question that when faults occur either the aircraft system dynamics changes due to the fault or these dynamics are unknown (precisely). This question is addressed for the important case of Air Data Sensor failures, due to e.g. icing, for fixed wing aircraft operating in a nominal fight condition. The solution to this question uses basic ideas from subspace Identification to cast this problem in linear least squares problem with convex constraints (nuclear norm and 1-norm constraints). The latter are relaxations of a rank and cardinality constraint. The presented solution is validated using real-life fight test data.

We propose to use the State Estimation by Sum-of-Norms Regularisation (STATESON-)algorithm for recovering the tip-sample interaction in high-speed tapping mode atomic force microscopy (AFM). This approach enables accurate sample height estimation for each independent cantilever oscillation period, provided that the tip-sample interaction dominates the noise. The entire course of the cantilever deflection signal is compared to a modelled counterpart in subsequent convex minimisations, such that the sparse tip-sample interaction can be recovered. Afterwards, the sample height is determined using the minimum smoothed cantilever deflection per cantilever oscillation period. Results from simulation experiments are in favour of the proposed approach as it consistently reveals sharp edges in sample height, as opposed to both the conventional and a closely related existing approach. However, the non-processed cantilever deflection provided most accurate sample height estimation. It is recommended to implement the STATESON-algorithm in the form of a filter to use it in feedback control of the scanner and cantilever excitation.

Model-based fault diagnosis for dynamical systems is a sophisticated task due to model inaccuracies, measurement noise and many possible fault scenarios. By presenting faults in terms of a dictionary, the latter obstacle is recently addressed using well-known techniques for recovering sparse information (e.g. lasso). However, current state-of-the-art methods still require accurate models and measurements for adequate diagnosis. In our contribution we address the problem of data-driven fault diagnosis in the sense that the model of the linear time-invariant (LTI) system is unknown in addition to the fault. Moreover, our aim is to diagnose (concurrent) faults while only having input/output data and the fault dictionary. This implies the user simply plugs in the data and specifies the set of possible faults in order to know the active faults together with an estimate of the dynamic model. The problem is formulated within a blind system identification context resulting in computationally efficient solutions based on convex optimization.

We investigate the general adjustment of projection-based phase retrieval algorithms for use with saturated data. In the phase retrieval problem, model fidelity of experimental data containing a non-zero background level, fixed pattern noise, or overexposure, often presents a serious obstacle for standard algorithms. Recently, it was shown that overexposure can help to increase the signal-to-noise ratio in AI applications. We present our first results in exploring this direction in the phase retrieval problem, using as an example the Gerchberg-Saxton algorithm with simulated data. The proposed method can find application in microscopy, characterisation of precise optical instruments, and machine vision applications of Industry4.0.

Some applications require high level of image-based classification certainty while keeping the total illumination energy as low as possible. Examples are minimally invasive visual inspection in Industry 4.0, and medical imaging systems such as computed tomography, in which the radiation dose should be kept “as low as is reasonably achievable”. We introduce a sequential object recognition scheme aimed at minimizing phototoxicity or bleaching while achieving a predefined level of decision accuracy. The novel online procedure relies on approximate weighted Bhattacharyya coefficients for determination of future inputs. Simulation results on the MNIST handwritten digit database show how the total illumination energy is decreased with respect to a detection scheme using constant illumination.

We demonstrate a novel closed-loop input design technique on the detection of particles in an imaging system such as a fluorescence microscope. The probability of misdiagnosis is minimized while constraining the input energy such that for instance phototoxicity is reduced. The key novelty of the closed-loop design is that each next input is designed based on the most recent information. Using updated hypothesis probabilities, the input energy distribution is optimized for detection such that unresolved pixels have increased illumination next image acquisition. As compared to conventional open-loop, the results show that (regions of) particles are diagnosed using less energy in the closed-loop approach. Besides the closed-loop approach being viable for particle detection in fluorescence microscopy measurements, it can be developed further to apply in different areas such as sequential object segmentation for reliable and efficient product inspection in Industry 4.0.