Authored

14 records found

Phase retrieval from overexposed PSF

A projection-based approach

We investigate the general adjustment of projection-based phase retrieval algorithms for use with saturated data. In the phase retrieval problem, model fidelity of experimental data containing a non-zero background level, fixed pattern noise, or overexposure, often presents a ser ...
This manuscript presents an improvement of state-of-the-art Closed-Loop Active Model Diagnosis (CLAMD). The proposed method utilizes weighted Bhattacharyya coefficients evaluated at the vertices of the polytopic constraint set to provide a good trade-off between computational eff ...
Motivated by a number of questions concerning transversality-type properties of pairs of sets recently raised by Ioffe and Kruger, this paper reports several new characterizations of the intrinsic transversality property in Hilbert spaces. New results in terms of normal vectors c ...
We present necessary conditions for monotonicity of fixed point iterations of mappings that may violate the usual nonexpansive property. Notions of linear-type monotonicity of fixed point sequences—weaker than Fejér monotonicity—are shown to imply metric subregularity. This, toge ...
We present the convergence analysis of convex combination of the alternating projection and Douglas–Rachford operators for solving the phase retrieval problem. New convergence criteria for iterations generated by the algorithm are established by applying various schemes of numeri ...
We develop a framework for quantitative convergence analysis of Picard iterations of expansive set-valued fixed point mappings. There are two key components of the analysis. The first is a natural generalization of single-valued averaged mappings to expansive set-valued mappings ...
This paper proposes an algorithm for solving structured optimization problems, which covers both the backward–backward and the Douglas–Rachford algorithms as special cases, and analyzes its convergence. The set of fixed points of the corresponding operator is characterized in sev ...
We develop for the first time a mathematical framework in which the class of projection algorithms can be applied to high numerical aperture (NA) phase retrieval. Within this framework, we first analyze the basic steps of solving the high-NA phase retrieval problem by projection ...
We demonstrate a novel closed-loop input design technique on the detection of particles in an imaging system such as a fluorescence microscope. The probability of misdiagnosis is minimized while constraining the input energy such that for instance phototoxicity is reduced. The ke ...
We investigate the role of error bounds, or metric subregularity, in the convergence of Picard iterations of nonexpansive maps in Hilbert spaces. Our main results show, on one hand, that the existence of an error bound is sufficient for strong convergence and, on the other hand, ...
We present a convex relaxation-based algorithm for large-scale general phase retrieval problems. General phase retrieval problems include, e.g., the estimation of the phase of the optical field in the pupil plane based on intensity measurements of a point source recorded in the i ...
We present an efficient phase retrieval approach for imaging systems with high numerical aperture based on the vectorial model of the point spread function. The algorithm is in the class of alternating minimization methods and can be adjusted for applications with either known or ...
We consider the extension of the traditional projection-based phase retrieval algorithms by increasing the problem dimensionality and introducing novel projection operators. The approach is demonstrated on an example of phase retrieval for the high-NA case.@en
We consider the extension of the traditional projection-based phase retrieval algorithms by increasing the problem dimensionality and introducing novel projection operators. The approach is demonstrated on an example of phase retrieval for the high-NA case.@en

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Microscopic imaging has a resolution that is often far from the diffraction limit due to aberrations induced by the optics or by the sample itself. It is therefore of interest sensing these aberrations either directly or indirectly to improve image quality in post-processing or w ...