L

LJ Seijbel

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13 records found

Dislocations in thin metal films observed with X-ray diffraction.
Conference paper - LJ Seijbel, R. Delhez

Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallite size
Journal article - J.D. Kamminga, LJ Seijbel

Relation between texture and stress in thin sputtered molybdenum layers.
Conference paper - IM van den Berk, LJ Seijbel, R. Delhez

Size-strain analysis using diffraction-line profiles from tilted specimens
Report - LJ Seijbel, R. Delhez

Relation between macro- and microstress in thin metallic layers.
Conference paper - LJ Seijbel, R. Delhez

Defects and morphological changes in nanothin Cu films on Mo(100) studied by thermal helium desorption spectrometry

Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials
Book chapter - J. Kamminga, LJ Seijbel, R. Delhez

Dislocation studies of thin layers under stress
Conference paper - LJ Seijbel, J. Kamminga, R. Delhez

Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallize size
Journal article - J. Kamminga, LJ Seijbel

Morphology changes in thin Cu films on Mo

Early stages of IBAD-film growth: Differences between (100) and polycrystalline Mo substrates.

Size-strain analysis using diffraction-line profiles from tilted specimens
Poster - LJ Seijbel, R. Delhez

Thin Cu films on Mo analyzed by thermal helium desorption spectrometry