Defects and morphological changes in nanothin Cu films on Mo(100) studied by thermal helium desorption spectrometry

Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallite size

Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallize size

Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials

Dislocation studies of thin layers under stress

Size-strain analysis using diffraction-line profiles from tilted specimens

Size-strain analysis using diffraction-line profiles from tilted specimens

Morphology changes in thin Cu films on Mo

Thin Cu films on Mo analyzed by thermal helium desorption spectrometry

Relation between texture and stress in thin sputtered molybdenum layers.

Dislocations in thin metal films observed with X-ray diffraction.

Relation between macro- and microstress in thin metallic layers.

Early stages of IBAD-film growth: Differences between (100) and polycrystalline Mo substrates.