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EF
EM Franken
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Authored
3 records found
Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy
Journal article -
M. Vulovic
,
EM Franken
,
RBG Ravelli
,
L.J. van Vliet
,
B. Rieger
Fast, spatially varying CTF correction in TEM
Journal article -
L.M. Voortman
,
EM Franken
,
L.J. van Vliet
,
B. Rieger
Quantifying resolution limiting factors in subtomogram averaged cryo-electron tomography using simulations
Journal article -
L.M. Voortman
,
M. Vulovic
,
M Maletta
,
A Voigt
,
EM Franken
,
A Simonetti
,
PJ Peters
,
L.J. van Vliet
,
B. Rieger