Jv

Jeffrey van der Voort

Authored

2 records found

Recently, there has been an increase in literature about the Double Descent phenomenon for heavily over-parameterized models. Double Descent refers to the shape of the test risk curve, which can show a second descent in the over-parameterized regime, resulting in the remarkable c ...
The goal of this thesis is to estimate parameters in a bidimensional Ornstein-Uhlenbeck process, namely a diffusion model which can be found in Favetto and Samson (2010), which considers plasma and interstitium concentrations. We first look at a general linear stochastic differen ...