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KE
K Eeckhout
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Authored
2 records found
Revealing trap depth distributions in persistent phosphors
Journal article -
K Eeckhout
,
A.J.J. bos
,
D. Poelman
,
PF Smet
Temperature and wave length dependent trap filling in M2Si5N8:Eu (M¼Ca, Sr,Ba) persistent phosphors
Journal article -
PF Smet
,
K Eeckhout
,
A.J.J. bos
,
E. van der Kolk
,
P. Dorenbos