With operando transmission electron microscopy visualizing the solid-solid electrode-electrolyte interface of silicon active particles and lithium oxide solid electrolyte as a model system, we show that (de)lithiation (battery cycling) does not require all particles to be in direct contact with electrolytes across length scales of a few hundred nanometers. A facile lithium redistribution that occurs between interconnected active particles indicates that lithium does not necessarily become isolated in individual particles due to loss of a direct contact. Our results have implications for the design of all-solid-state battery electrodes with improved capacity retention and cyclability. ©@en

Conformal coating of silicon (Si) anode particles is a common strategy for improving their mechanical integrity, to mitigate battery capacity fading due to particle volume expansion, which can result in particle crumbling due to lithiation induced strain and excessive solid-electrolyte interface formation. Here, we use operando transmission electron microscopy in an open cell to show that TiO2 coatings on Si/SiO2 particles undergo thickness dependent rupture on battery cycling where thicker coatings crumble more readily than thinner (∼5 nm) coatings, which corroborates the difference in their capacities.@en

We use off-axis electron holography to measure the electrostatic charge density distributions on graphene-based nanogap devices that have thicknesses of between 1 and 10 monolayers and separations of between 8 and 58 nm with a precision of better than a single unit charge. Our experimental measurements, which are compared with finite element simulations, show that wider graphene tips, which have thicknesses of a single monolayer at their ends, exhibit charge accumulation along their edges. The results are relevant for both fundamental research on graphene electrostatics and applications of graphene nanogaps to single nucleotide detection in DNA sequencing, single molecule electronics, plasmonic antennae, and cold field emission sources.@en