S

SYY Leung

Authored

9 records found

Microelectronic packages can be considered as composite structures fabricated from highly dissimilar materials. Interface delamination related failure often occurs when the packaged devices are subjected to thermo-mechanical loading. The analysis of delamination of a laminate str ...
We proposed a molecular modeling methodology to study the protonic acid doping of emeraldine base polyaniline which can be used in gas detection. The commerical forcefield COMPASS was used for the polymer and protonic acid molecules. The molecular model, which is capable of repre ...
Delamination between copper and epoxy molding compound (EMC) is one of the common failure modes in packages due to relatively weak adhesion at the interface. Delamination is difficult to predict because a package is often with a complex structure design constructed with different ...