In order to investigate the thermal behaviour of radiation induced point defects in nuclear graphite, ETU10 graphite was implanted with 350 keV C⁺ ion to doses of 10¹⁵ and 10¹⁶ cm^-2. The point defects introduced by the implantation were characterized by Positron Annihilation Doppler Broadening (PADB) and their thermal behaviour was studied during "in situ" annealing at Delft Variable Energy Positron beam (VEP). The annealing was performed for 5 minutes at temperatures ranging from 300 K (as implanted) to 1500 K in steps of 100 K. For both doses, an annealing stage at around 450 K is observed followed by a second stage around 700 K. For the high dose implantation vacancy complexes are found which are stable up to a temperature around 1400K.