Effect of porous Cu addition on the microstructure and mechanical properties of SnBi-xAg solder joints
Yang Liu (Yangzhou University)
Boqiao Ren (Yangzhou University, Harbin University of Science and Technology)
Min Zhou (Yangzhou University)
Yuxiong Xue (Yangzhou University)
Xianghua Zeng (Yangzhou University)
Fenglian Sun (Harbin University of Science and Technology)
X.J. Fan (Lamar University)
Guogi Zhang (TU Delft - Electronic Components, Technology and Materials)
More Info
expand_more
Abstract
The effects of porous copper (P-Cu) on the microstructure, hardness, and shear strength of SnBi, SnBi-0.4Ag, and SnBi-1Ag solder joints were investigated in this paper. The experimental results show that P-Cu frames distribute in the solder bulks and form triangular areas. The addition of P-Cu leads to the microstructural refinement in the enclosed areas by the P-Cu frames in the solder bulks. The average hardness here is increased due to the fine grain strengthening mechanism. The SnBi-1Ag@P-Cu solder bulk shows smaller Bi-rich grains but larger β-Sn dendrites than the other two P-Cu-enhanced solder bulks. Porous Cu exists as a frame structure in the solder joints, which hinders the initiation and propagation of cracks and has a positive effect on the improvement of joint strength. Compared to the SnBi and SnBiAg solder joints, the shear strength of the P-Cu-enhanced solder joints is increased by 15%. The average shear strength of the SnBi-0.4Ag@P-Cu solder joint is 79.34 MPa, which is the highest among all the solder joints investigated in this study.
No files available
Metadata only record. There are no files for this record.