Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental environment
Journal Article
(2013)
Author(s)
L. Shi (TU Delft - Electronic Instrumentation)
Stoyan Nihtianov (TU Delft - Electronic Instrumentation)
L. K. Nanver (TU Delft - Electronic Components, Technology and Materials)
F Scholze (External organisation)
Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/JSEN.2012.2235142
To reference this document use:
https://resolver.tudelft.nl/uuid:00a8d7e0-e24e-42f4-a034-73f9efd08c50
More Info
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Publication Year
2013
Language
English
Research Group
Electronic Instrumentation
Issue number
5
Volume number
13
Pages (from-to)
1699-1707
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